nRF51 SDK
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RAM Retention Example Application main file. More...
Macros | |
#define | RAM_MEMORY_TEST_ADDRESS (0x20002000UL) |
#define | RAM_MEMORY_TEST_WORD (0xFEEDBEEFUL) |
#define | RESET_MEMORY_TEST_BYTE (0x0DUL) |
#define | MAX_TEST_ITERATIONS (1) |
#define | SUCCESS_OUTPUT_VALUE (0xAB) |
#define | PIN_GPIO_WAKEUP (7) |
Functions | |
void | HardFault_Handler () |
Function for handling HardFaults. In case something went wrong or System OFF did not work and reached the end of the program. | |
static void | gpio_config (void) |
Function for configuring I/O pins 8 - 16 as output, and pin 7 as wake up source. | |
static void | display_failure (void) |
Function for indicating failure by turning on all LEDs. | |
int | main (void) |
Function for application main entry. | |
This file contains the source code for a sample application using RAM retention.
#define RAM_MEMORY_TEST_ADDRESS (0x20002000UL) |
Address in RAM where test word (RAM_MEMORY_TEST_WORD) is written before System OFF and checked after System RESET.
#define RAM_MEMORY_TEST_WORD (0xFEEDBEEFUL) |
Test word that is written to RAM address RAM_MEMORY_TEST_ADDRESS.
#define RESET_MEMORY_TEST_BYTE (0x0DUL) |
Known sequence written to a special register to check if this wake up is from System OFF.
#define MAX_TEST_ITERATIONS (1) |
Maximum number of iterations this example will run.
#define SUCCESS_OUTPUT_VALUE (0xAB) |
If RAM retention is tested for MAX_TEST_ITERATIONS, this value will be given as output.
#define PIN_GPIO_WAKEUP (7) |
GPIO pin configured to wake up system from System OFF on falling edge. It can be connected to a button which is high when not pressed.